Innovative scanning electron microscopy (SEM) and transmission electron microscopy (TEM) techniques are used to understand the micro-physical basis of Earth material properties.  We use: electron backscattered diffraction (EBSD) in the SEM to map the crystal orientations and textures of a range of materials including ice (cryo EBSD): cathodoluminescence to probe defect structures and chemistry of a wide range of microstructures: and fast ion beam (FIB) SEM tomography to study three dimensional pore-networks of fluids (water, oil and melts) in rocks at the nanoscale.  The FIB-SEM is also applied to studies of crystal growth of natural and synthetic minerals, including diamonds from the deep continental lithosphere and synthetic zeolites, which are important industrial catalysts. 

  • Scanning Electron Microscopes:
    1. FEI Nova 600 Nanolab, equipped with EDS, EBSD, cryo stage, panchromatic CL.
    2. FEI XL30S FEG, equipped with EDS, EBSD, panchromatic CL.
    3. JEOL Neoscope II JCM-6000, equipped with SDD EDS.
  • Transmission Electron Microscopes (including cryo holder):
    1. FEI Tecnai 10
    2. FEI Tecnai 12
    3. FEI Tecnai 12 ICORR
    4. FEI Tecnai 20 with STEM, BF and DF
    5. FEI Tecnai 20 FEG with STEM, HAADF, EDX, DF, BF and SE
  • Microprobe:
    1. JEOL JXA-8530F Hyperprobe Field Emission Electron probe microanalyser, equipped with, 5 WDS spectrometers, SDD ED system, CL panchromatic and xCLent systems. Booking

Other specialist equipment:

  • Atomic Force Microscopy
  • Avizo workstation
  • Gatan Argon ion milling