Innovative scanning electron microscopy (SEM) and transmission electron microscopy (TEM) techniques are used to understand the micro-physical basis of Earth material properties. We use: electron backscattered diffraction (EBSD) in the SEM to map the crystal orientations and textures of a range of materials including ice (cryo EBSD): cathodoluminescence to probe defect structures and chemistry of a wide range of microstructures: and fast ion beam (FIB) SEM tomography to study three dimensional pore-networks of fluids (water, oil and melts) in rocks at the nanoscale. The FIB-SEM is also applied to studies of crystal growth of natural and synthetic minerals, including diamonds from the deep continental lithosphere and synthetic zeolites, which are important industrial catalysts.
- Scanning Electron Microscopes:
- FEI Nova 600 Nanolab, equipped with EDS, EBSD, cryo stage, panchromatic CL.
- FEI XL30S FEG, equipped with EDS, EBSD, panchromatic CL.
- JEOL Neoscope II JCM-6000, equipped with SDD EDS.
- Transmission Electron Microscopes (including cryo holder):
- FEI Tecnai 10
- FEI Tecnai 12
- FEI Tecnai 12 ICORR
- FEI Tecnai 20 with STEM, BF and DF
- FEI Tecnai 20 FEG with STEM, HAADF, EDX, DF, BF and SE
- JEOL JXA-8530F Hyperprobe Field Emission Electron probe microanalyser, equipped with, 5 WDS spectrometers, SDD ED system, CL panchromatic and xCLent systems. Booking
Other specialist equipment:
- Atomic Force Microscopy
- Avizo workstation
- Gatan Argon ion milling