2023

Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics
J. Seifert, Y. Shao, R. van Dam, D. Bouchet, T. van Leeuwen, A.P. Mosk, Optics Letters 48 (22), 6027-6030 (2023). DOI: 10.1364/OL.502344.

Preface: Iontronics: from fundamentals to ion-controlled devices
S. Faez and S.G. Lemay, Faraday Discussions 246, 9-10 (2023). DOI: 10.1039/D3FD90050A

Cove-Edged Chiral Graphene Nanoribbons with Chirality Dependent Bandgap and Carrier Mobility
K. Liu, W. Zheng, S. Osella, Z.L. Qiu, S. Böckmann, W. Niu, L. Meingast, H. Komber, S. Obermann, R. Gillen, M. Bonn, M.R. Hansen, J. Maultzsch, H.I. Wang, Ji Ma, X. Feng, Journal of the American Chemical Society 146 (1), 1026-1034 (2023). DOI: 10.1021/jacs.3c11975

Tuning the inter-Nanoplatelet Distance and Coupling Strength by Thermally Induced Ligand Decomposition
S. Chen, S.H. Al-Hilfi, G. Chen, H. Zhang, W. Zheng, L. Di Virgilio, J.J. Geuchies, J. Wang, X. Feng, A. Riedinger, M. Bonn, H.I. Wang, Nano Micro Small preprint 2308951 (2023). DOI: 10.1002/smll.202308951

Pulse duration dependence of single-shot pulsed laser ablation of gallium based III-V compound semiconductors
M.C.W. Vreugdenhil and D. van Oosten, Proceedings SPIE 12726, Laser-Induced Damage in Optical Materials 2023, 1272609 (2023). DOI:10.1117/12.2685122

Open hardware in microscopy
J. Hohlbein and S. Faez, HardwareX 15, e00473 (2023). DOI: 10.1016/j.ohx.2023.e00473

Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics
J. Seifert, Y. Shao, R. van Dam, D. Bouchet, T. van Leeuwen and A.P. Mosk, Optics Letters 48 (22), 6027-6030 (2023). DOI: 10.1364/OL.502344

Sub-nanometer measurement of transient structural changes in dye-doped polystyrene microspheres
P. Asgari, I.B. Dogru Yüksel, G.A. Blab, H.C. Gerritsen and A.P. Mosk, Optics Continuum 2 (2), 259-265 (2023). DOI: 10.1364/OPTCON.477703

Iontronic microscopy of a tungsten microelectrode: “seeing” ionic currents under an optical microscope
Z. Zhang and S. Faez, Faraday Discussions 246, 426-440 (2023). DOI: 10.1039/D3FD00040K

Dark-field light scattering microscope with focus stabilization
A. Peters, Z. Zhang and S. Faez, HardwareX 14, E00424 (2023). DOI: 10.1016/j.ohx.2023.e00424