Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics
J. Seifert, Y. Shao, R. van Dam, D. Bouchet, T. van Leeuwen and A.P. Mosk, Optics Letters 48 (22), 6027-6030 (2023). DOI: 10.1364/OL.502344

Sub-nanometer measurement of transient structural changes in dye-doped polystyrene microspheres
P. Asgari, I.B. Dogru Yüksel, G.A. Blab, H.C. Gerritsen and A.P. Mosk, Optics Continuum 2 (2), 259-265 (2023). DOI: 10.1364/OPTCON.477703

Iontronic microscopy of a tungsten microelectrode: “seeing” ionic currents under an optical microscope
Z. Zhang and S. Faez, Faraday Discussions 246, 426-440 (2023). DOI: 10.1039/D3FD00040K

Dark-field light scattering microscope with focus stabilization
A. Peters, Z. Zhang and S. Faez, HardwareX 14, E00424 (2023). DOI: 10.1016/j.ohx.2023.e00424